
Thank you for Control 2025
ZEISS QUALITY INNOVATIONS at CONTROL
Innovations that Drive Efficiency
Thank you for visiting Control 2025!
From May 6 to 9, our innovations in the fields of X-ray systems, CMMs, optical 3D systems and industrial microscopes were featured at Control. In Stuttgart, we showed how ZEISS is setting new standards in the efficiency and flexibility of industrial metrology. The industry-specific Lunch Talks with renowned speakers especially inspired our attendees. The synergy of software and measurement technology as well as numerous guided tours of our booth were also exciting highlights.
A big thank you to everyone who joined us!