ZEISS at Control 2025
Thank you for Control 2025

ZEISS QUALITY INNOVATIONS at CONTROL

Innovations that Drive Efficiency

Thank you for visiting Control 2025!

From May 6 to 9, our innovations in the fields of X-ray systems, CMMs, optical 3D systems and industrial microscopes were featured at Control. In Stuttgart, we showed how ZEISS is setting new standards in the efficiency and flexibility of industrial metrology. The industry-specific Lunch Talks with renowned speakers especially inspired our attendees. The synergy of software and measurement technology as well as numerous guided tours of our booth were also exciting highlights.

A big thank you to everyone who joined us!

Join our #measuringhero Jay on the innovation tour

Experience our latest innovations from the Control. Jay Elepano will introduce you to the highlights in our product and software portfolio and provide some insider information.

The new issue is out now

Read all about our customer’s success stories, industry insights and our innovations
in the full PDF version and get inspired for your daily quality tasks.

Contact us

Would you like to learn more about our products or services? We are happy to provide you with more information or a demo – from remote or onsite.

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